Multiple fault diagnosis of analog circuits by locating ambiguity groups of test equation
نویسندگان
چکیده
This paper proposes a method to diagnose the multiple faults in the linear analog circuits. Test equation establishes the relationship between the measured responses and faulty excitations due to faulty elements. The QR factorization is applied to identify ambiguity groups in the test verification matrix. The suspicious faulty excitations of the minimum size are determined. Faulty parameters are evaluated using the structural incident signal matrix. Finally this method is illustrated with an example circuit.
منابع مشابه
A Method for Multiple Fault Diagnosis in Analog Circuits
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